We’re excited to announce that part number 6749W10P008 is now available in our ready-to-ship inventory. Part number 6749W10P008 is a Semiconductor Device Diode manufactured by Testing Lab Of North America Inc with FSC 5961 Semiconductor Devices and Associated Hardware. Are you interested in a quick and competitive quote for this part? If so, just fill out the short Request for Quote (RFQ) form below to get started.
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MRC | Criteria | Characteristic |
---|---|---|
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS AMBIENT AIR |
ADAV | OVERALL DIAMETER | 0.085 INCHES MINIMUM AND 0.140 INCHES MAXIMUM |
ABJT | TERMINAL LENGTH | 1.250 INCHES NOMINAL |
ABHP | OVERALL LENGTH | 0.230 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
CTQX | CURRENT RATING PER CHARACTERISTIC | 7.50 MILLIAMPERES NOMINAL VOLTAGE REGULATOR DIODE CURRENT |
CBBL | FEATURES PROVIDED | QUALITY ASSURANCE LEVEL TXV |
TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 8.5 MINIMUM BREAKDOWN VOLTAGE, INSTANTANEOUS AND 9.4 MAXIMUM BREAKDOWN VOLTAGE, INSTANTANEOUS |
AXGY | MOUNTING METHOD | TERMINAL |
ABBH | INCLOSURE MATERIAL | GLASS OR PLASTIC |
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